ASHOK NANDIGAM. Simplifying Post-Silicon Diagnostics Using Large Language Models for Advanced Node Yield Improvement. Journal of Computational Analysis and Applications (JoCAAA), [S. l.], v. 35, n. 3, p. 219–228, 2026. Disponível em: https://www.eudoxuspress.com/index.php/pub/article/view/5108. Acesso em: 10 aug. 2026.